Technical Program

Paper Detail

Paper:IVMSP-P9.1
Session:Image Analysis II
Location:Poster Area B
Session Time:Thursday, May 30, 08:00 - 10:00
Presentation Time:Thursday, May 30, 08:00 - 10:00
Presentation: Poster
Topic: Image, Video, and Multidimensional Signal Processing: Image/Video Processing
Paper Title: ANALYSIS OF PATCH-BASED SIMILARITY METRICS: APPLICATION TO DENOISING
Authors: Mounira Ebdelli, INRIA, France; Olivier Le Meur, IRISA, France; Christine Guillemot, INRIA, France