| Authors: |
Oldrich Plchot, Brno University of Technology, Czech Republic; Spyros Matsoukas, Raytheon BBN Technologies, United States; Pavel Matejka, Brno University of Technology, Czech Republic; Najim Dehak, Massachusetts Institute of Technology, United States; Jeff Ma, Raytheon BBN Technologies, United States; Sandro Cumani, Ondrej Glembek, Brno University of Technology, Czech Republic; Hynek Hermansky, Sri Harish Mallidi, Johns Hopkins University, United States; Nima Mesgarani, University of Maryland, United States; Richard Schwartz, Raytheon BBN Technologies, United States; Mehdi Soufifar, Brno University of Technology, Czech Republic; Zheng-Hua Tan, Aalborg University, Denmark; Samuel Thomas, Johns Hopkins University, United States; Bing Zhang, Raytheon BBN Technologies, United States; Xinhui Zhou, University of Maryland, United States |
